An application of a p-chart is

An application of a p-chart is given in the NIST/SEMATECH e-Handbook of Statistical Methods at pmc/section3/pmc332.htm. Specifically, chips on a wafer were investigated and a nonconforming unit was said to occur whenever there was a misregistration in terms of horizontal and/or vertical distances from the center. Thirty wafers were examined and there were 50 chips on each wafer, with the proportion of misreg-istrations over the 50 chips per wafer recorded for each wafer. The average of the proportions is .2313.

(a) Would it be necessary to use the Ryan–Schwertman control limits in Section, or should 3-sigma limits suffice? Explain.

(b) Compute both sets of limits and comment.

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